Revision 456, 1.2 kB
(checked in by vbarta, 15 years ago)
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custom test location for harness tests (extended UnitTest?++), configurable tolerance - all tests pass (most of the time)
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1 | #define BDMLIB // not an ideal way to prevent double registration of UI factories... |
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2 | #include "base/bdmbase.h" |
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3 | #include "base/user_info.h" |
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4 | #include "stat/exp_family.h" |
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5 | #include "stat/emix.h" |
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6 | #include "itpp_ext.h" |
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7 | #include "mpdf_harness.h" |
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8 | #include "mat_checks.h" |
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9 | #include "UnitTest++.h" |
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10 | |
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11 | using namespace bdm; |
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12 | |
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13 | const double epsilon = 0.00001; |
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14 | |
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15 | TEST(test_mepdf) { |
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16 | mpdf_harness::test_config("mepdf.cfg"); |
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17 | } |
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18 | |
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19 | TEST(test_mepdf_sample) { |
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20 | // Setup model |
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21 | vec mu("1.1 -1"); |
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22 | ldmat R(mat("1 -0.5; -0.5 2")); |
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23 | |
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24 | RV x("{x }"); |
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25 | RV y("{y }"); |
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26 | |
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27 | enorm<ldmat> E; |
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28 | E.set_rv(concat(x, y)); |
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29 | E.set_parameters(mu, R); |
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30 | |
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31 | epdf *Mg = E.marginal(y); |
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32 | CHECK_CLOSE(vec("-1"), Mg->mean(), epsilon); |
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33 | |
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34 | // putting them back together |
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35 | mpdf *Cn = E.condition(x); |
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36 | mepdf mMg(Mg); |
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37 | Array<mpdf *> A(2); |
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38 | A(0) = Cn; |
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39 | A(1) = &mMg; |
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40 | mprod mEp(A); |
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41 | |
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42 | int n = 1000; |
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43 | mat smp = mEp.samplecond(vec(0), n); |
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44 | vec emu = sum(smp, 2) / n; |
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45 | CHECK_CLOSE(mu, emu, 0.3); |
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46 | |
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47 | mat er = (smp * smp.T()) / n - outer_product(emu, emu); |
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48 | CHECK_CLOSE(R.to_mat(), er, 0.3); |
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49 | |
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50 | // test of pdflog at zero |
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51 | vec zero(0); |
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52 | vec zero2("0 0"); |
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53 | CHECK_CLOSE(E.evallog(zero2), mEp.evallogcond(zero2, zero), epsilon); |
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54 | } |
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